MENU
[S9-2] Characterization of vacancy-type defects in Mg- and N-implanted GaN by using a monoenergetic positron beam
Authors: Akira Uedono, Ryo Tanaka, Shinya Takashima, Katsunori Ueno, Masaharu Edo, Kohei Shima, Shigefusa F. Chichibu, Jun Uzuhashi, Tadakatsu Ohkubo, Shoji Ishibashi, Kacper Sierakowski, and Michal Bockowski
[S7-2] Jaehyo Jang (Institute of Science Tokyo)
Paper title: P-type doping of PVD-MoS2 film with nitrogen annealing accelerated by hydrogen incorporation
[S8-1] Rahul Rai (National Yang Ming Chiao Tung University)
Paper title:
Enhancement-mode GaN Tri-gate MISHEMT with Fluorine Doped Charge Trapping Layer in Hybrid Ferroelectric Gate Stack
His smile makes all of us in the field of junction technology happy.
Without his courage, nothing had progressed.
Paper title: Innovative Annealing Technology for Thermally Stable Ni(GeSn) Alloys
Paper title: A Novel Method to Improve CMP Selectivity by Ultra-High-Dose Ion Implantation
Shuo Yuan/ Renesas Electronics Corp.
Nada Zerhouni Abdou/ CEA Leti and IMEP-LAHC